+ v1.5.8 (2014-08-08)
+ git tag: KARO-TX51-2014-08-08
+ Changes:
+ TX51:
+ - explicitly program the padctl settings for SDRAM and NAND from
+ the DCD to ensure correct settings after soft reset.
+ - reduce DSE values for SDRAM and NAND control lines for better
+ error margins in NAND detection and SDRAM stress test.
+ - Revert the change of the NFC clock frequency from the previous
+ release, as this is not necessary any more with the improved
+ pad settings.
+