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(parent: 1f7b06e) | patch
arm: sama5d3: remove unused define
authorBo Shen <voice.shen@atmel.com>
Fri, 9 Aug 2013 07:45:39 +0000 (15:45 +0800)
committerAndreas Bießmann <andreas.devel@googlemail.com>
Thu, 22 Aug 2013 14:51:03 +0000 (16:51 +0200)
commit5471c4a862ce8c9e3340501d0f1968cbf1abf56a
tree8931966dd380507514c9643a5f33073bec98fbaetree | snapshot
parent1f7b06ee5f791c3f3c02c5389bbb4a602cef5ad1commit | diff
arm: sama5d3: remove unused define

The CONFIG_MAX_NAND_CHIPS never used, remove it
No where define LCD_TEST_PATTERN, so no need undefine

Signed-off-by: Bo Shen <voice.shen@atmel.com>
Signed-off-by: Andreas Bießmann <andreas.devel@googlemail.com>
include/configs/sama5d3xek.h diff | blob | history
UBoot for KaRo TX COM modules