int total_add;
};
+/**
+ * struct dm_test_parent_data - parent's information on each child
+ *
+ * @sum: Test value used to check parent data works correctly
+ * @flag: Used to track calling of parent operations
+ */
+struct dm_test_parent_data {
+ int sum;
+ int flag;
+};
+
/*
* Operation counts for the test driver, used to check that each method is
* called correctly
* @fail_count: Number of tests that failed
* @force_fail_alloc: Force all memory allocs to fail
* @skip_post_probe: Skip uclass post-probe processing
+ * @removed: Used to keep track of a device that was removed
*/
struct dm_test_state {
struct udevice *root;
int fail_count;
int force_fail_alloc;
int skip_post_probe;
+ struct udevice *removed;
};
/* Test flags for each test */