-/*
- * omap_rotate_ecc_bch - Rotate the syndrome bytes
- *
- * @mtd: MTD device structure
- * @calc_ecc: ECC read from ECC registers
- * @syndrome: Rotated syndrome will be retuned in this array
- *
- */
-static void omap_rotate_ecc_bch(struct mtd_info *mtd, uint8_t *calc_ecc,
- uint8_t *syndrome)
-{
- struct nand_chip *chip = mtd->priv;
- struct nand_bch_priv *bch = chip->priv;
- uint8_t n_bytes = 0;
- int8_t i, j;
-
- switch (bch->type) {
- case ECC_BCH4:
- n_bytes = 8;
- break;
-
- case ECC_BCH16:
- n_bytes = 28;
- break;
-
- case ECC_BCH8:
- default:
- n_bytes = 13;
- break;
- }
-
- for (i = 0, j = (n_bytes-1); i < n_bytes; i++, j--)
- syndrome[i] = calc_ecc[j];
-}
-
-/*
- * omap_fix_errors_bch - Correct bch error in the data
- *
- * @mtd: MTD device structure
- * @data: Data read from flash
- * @error_count:Number of errors in data
- * @error_loc: Locations of errors in the data
- *
- */
-static void omap_fix_errors_bch(struct mtd_info *mtd, uint8_t *data,
- uint32_t error_count, uint32_t *error_loc)
-{
- struct nand_chip *chip = mtd->priv;
- struct nand_bch_priv *bch = chip->priv;
- uint8_t count = 0;
- uint32_t error_byte_pos;
- uint32_t error_bit_mask;
- uint32_t last_bit = (bch->nibbles * 4) - 1;
-
- /* Flip all bits as specified by the error location array. */
- /* FOR( each found error location flip the bit ) */
- for (count = 0; count < error_count; count++) {
- if (error_loc[count] > last_bit) {
- /* Remove the ECC spare bits from correction. */
- error_loc[count] -= (last_bit + 1);
- /* Offset bit in data region */
- error_byte_pos = ((512 * 8) -
- (error_loc[count]) - 1) / 8;
- /* Error Bit mask */
- error_bit_mask = 0x1 << (error_loc[count] % 8);
- /* Toggle the error bit to make the correction. */
- data[error_byte_pos] ^= error_bit_mask;
- }
- }
-}
-